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Melanie Stiassny, American Museum of Natural History


  

Andrew Ramsey, Nikon Metrology


  

Guy Hamburger, ZEISS Metrology Services


   

Kyle Karasek, Tessy Plastics


  

Ryan Peitsch, National Technical Systems


  

David Bone, Delphi Precision Imaging Corporation


   

Daniel Coleff, Micro-XCT Laboratory Manager, NASA


   

Rebecka Eriksson, Saab Bofors Test Center


   

Kirill Kazmirchuk, NAMI Research Center